MODELING THE CRITICAL AREA IN YIELD FORECASTS

被引：62
作者：
FERRISPRABHU, AV
机构：
来源：
IEEE JOURNAL OF SOLID-STATE CIRCUITS | 1985年 / 20卷 / 04期
关键词：
D O I：
10.1109/JSSC.1985.1052403
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
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页码：874 / 878
页数：5
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