Timed verification of the generic architecture of a memory circuit using parametric timed automata

被引:22
作者
Chevallier, Remy [2 ]
Encrenaz-Tiphene, Emmanuelle [1 ]
Fribourg, Laurent [1 ]
Xu, Weiwen [1 ]
机构
[1] ENS Cachan, LSV, CNRS, Cachan, France
[2] STMicroelect, Cent R&D, FTM, Crolles, France
关键词
Memory circuit; Timed automata; Model checking;
D O I
10.1007/s10703-008-0061-x
中图分类号
TP301 [理论、方法];
学科分类号
081202 ;
摘要
Using a variant of Clariso-Cortadella's parametric method for verifying asynchronous circuits, we analyse some crucial timing behaviors of the architecture of SPSMALL memory, a commercial product of STMicroelectronics. Using the model of parametric timed automata and model checker HYTECH, we formally derive a set of linear constraints that ensure the correctness of the response times of the memory. We are also able to infer the constraints characterizing the optimal setup timings of input signals. We have checked, for two different implementations of this architecture, that the values given by our model match remarkably with the values obtained by the designer through electrical simulation.
引用
收藏
页码:59 / 81
页数:23
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