首页
学术期刊
论文检测
AIGC检测
热点
更多
数据
SOLVING THE TEST PROBLEM IN SCSI DISK DRIVES
被引:0
|
作者
:
不详
论文数:
0
引用数:
0
h-index:
0
不详
机构
:
来源
:
ELECTRONICS
|
1986年
/ 59卷
/ 07期
关键词
:
D O I
:
暂无
中图分类号
:
学科分类号
:
摘要
:
引用
收藏
页码:35 / 37
页数:3
相关论文
共 50 条
[1]
SCSI HARD DISK DRIVES FOR THE MACINTOSH
CRAWFORD, C
论文数:
0
引用数:
0
h-index:
0
CRAWFORD, C
WHITE, E
论文数:
0
引用数:
0
h-index:
0
WHITE, E
BYTE,
1987,
12
(05):
: 237
-
240
[2]
Safely swap SCSI disk drives
Godil, A
论文数:
0
引用数:
0
h-index:
0
机构:
Linear Technol Corp, Milpitas, CA 95035 USA
Linear Technol Corp, Milpitas, CA 95035 USA
Godil, A
EDN,
1999,
44
(20)
: 120
-
120
[3]
TAPE DRIVES CAN WORK LIKE DISK DRIVES IF YOU USE SCSI BUS
KOZLOWSKI, T
论文数:
0
引用数:
0
h-index:
0
KOZLOWSKI, T
EDN,
1988,
33
(12)
: 215
-
&
[4]
RIGOROUS TESTING OF SCSI DISK DRIVES AND ARRAYS ENSURES PEAK PERFORMANCE
SILVERMAN, HW
论文数:
0
引用数:
0
h-index:
0
SILVERMAN, HW
EDN,
1992,
37
(23)
: 149
-
&
[5]
SMART FAILURE-PREDICTION METHOD NOW BEING ENDORSED FOR SCSI DISK DRIVES
NASS, R
论文数:
0
引用数:
0
h-index:
0
NASS, R
ELECTRONIC DESIGN,
1995,
43
(15)
: 40
-
40
[6]
HOW TO TEST WINCHESTER DISK DRIVES
RUOFF, J
论文数:
0
引用数:
0
h-index:
0
RUOFF, J
COMPUTER DESIGN,
1984,
23
(05):
: 81
-
&
[7]
HOW TO TEST WINCHESTER DISK DRIVES.
Ruoff, Jerry
论文数:
0
引用数:
0
h-index:
0
Ruoff, Jerry
Electronic Systems Technology and Design/Computer Design's,
1984,
23
(05):
: 81
-
84
[8]
USING MARGIN ANALYSIS TO TEST DISK DRIVES
BARKER, B
论文数:
0
引用数:
0
h-index:
0
BARKER, B
ELECTRONIC ENGINEERING,
1984,
56
(692):
: 35
-
38
[9]
USING MARGIN ANALYSIS TO TEST DISK DRIVES.
Barker, Barry
论文数:
0
引用数:
0
h-index:
0
机构:
Shugart, UK, Shugart, UK
Shugart, UK, Shugart, UK
Barker, Barry
Electronic Engineering (London),
1984,
56
(692):
: 35
-
38
[10]
SCSI DRIVES - MASSIVE STORAGE FOR MULTIPLE PLATFORMS
APIKI, S
论文数:
0
引用数:
0
h-index:
0
APIKI, S
WSZOLA, S
论文数:
0
引用数:
0
h-index:
0
WSZOLA, S
GREHAN, R
论文数:
0
引用数:
0
h-index:
0
GREHAN, R
YAGER, T
论文数:
0
引用数:
0
h-index:
0
YAGER, T
BYTE,
1990,
15
(12):
: 172
-
&
←
1
2
3
4
5
→