TIME-OF-FLIGHT ATOM-PROBE FIELD-ION MICROSCOPE FOR STUDY OF DEFECTS IN METALS

被引：24
作者：
HALL, TM
WAGNER, A
BERGER, AS
SEIDMAN, DN
机构：
[1] CORNELL UNIV,DEPT MAT SCI & ENGN,ITHACA,NY 14853
[2] CORNELL UNIV,CTR MAT SCI,ITHACA,NY 14853
来源：
SCRIPTA METALLURGICA | 1976年 / 10卷 / 05期
关键词：
D O I：
10.1016/0036-9748(76)90178-2
中图分类号：
TF [冶金工业];
学科分类号：
0806 ;
摘要：
引用
收藏
页码：485 / 488
页数：4
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