2ND ORDER MOIRE ANALYSIS

被引:1
作者
KUHNERT, R
MICHEL, B
HENNIGER, K
机构
来源
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH | 1988年 / 109卷 / 02期
关键词
D O I
10.1002/pssa.2211090235
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
引用
收藏
页码:K93 / K95
页数:3
相关论文
共 15 条
[1]   RAPID INTERPRETATION OF MOIRE PHOTOGRAPHS [J].
BERANEK, WJ .
EXPERIMENTAL MECHANICS, 1968, 8 (06) :249-&
[2]  
DANTU P, 1966, MEM GAMAC, V17, P55
[3]  
DURELLI AJ, 1970, MOIRE ANAL STRAIN, P271
[4]  
Guild J., 1956, INTERFERENCE SYSTEM
[5]   MOIRE TECHNIQUES BY MEANS OF SCANNING ELECTRON-MICROSCOPY [J].
KUHNERT, R ;
MICHEL, B .
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1985, 89 (02) :K163-K165
[6]  
KUHNERT R, 1987, FMC SERIES, V30
[7]  
KUHNERT R, 1987, UNPUB APPLICATION MI
[8]  
KUHNERT R, 1987, Patent No. 247507
[9]   AUTOMATIC FRINGE PATTERN-ANALYSIS - A REVIEW [J].
REID, GT .
OPTICS AND LASERS IN ENGINEERING, 1986, 7 (01) :37-68
[10]   MOIRE FRINGES IN METROLOGY [J].
REID, GT .
OPTICS AND LASERS IN ENGINEERING, 1984, 5 (02) :63-93