ABUNDANCE OF MOLECULAR-IONS IN SECONDARY ION MASS-SPECTROMETRY

被引：15

作者：

MORGAN, AE ^{[1
]}

WERNER, HW ^{[1
]}

机构：

[1] PHILIPS RES LABS,EINDHOVEN,NETHERLANDS

来源：

APPLIED PHYSICS | 1976年 / 11卷 / 02期

关键词：

D O I：

10.1007/BF00920605

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：193 / 195

页数：3

共 11 条

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BUHL, R ;

PREISINGER, A .

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[3]

de la Berge, 1969, 5TH P INT C XRAY OPT, P311

[4]

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HARRISON, DE ;

DELAPLAIN, CB .

JOURNAL OF APPLIED PHYSICS, 1976, 47 (06) :2252-2259

[6] SECONDARY-ION MASS-SPECTROMETRY AND ITS USE IN DEPTH PROFILING [J].

LIEBL, H .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1975, 12 (01) :385-391

[7] QUANTITATIVE-ANALYSIS OF LOW-ALLOY STEELS BY SECONDARY ION MASS-SPECTROMETRY [J].

MORGAN, AE ;

WERNER, HW .

ANALYTICAL CHEMISTRY, 1976, 48 (04) :699-708

[8] EFFECT OF RESIDUAL OXYGEN ON FORMATION OF MOLECULAR IONS IN SECONDARY ION MASS-SPECTROMETRY [J].

PRAGER, M .

APPLIED PHYSICS, 1975, 8 (04) :361-362

[9] SURFACE OXIDATION STUDIES OF IRON USING STATIC METHOD OF SECONDARY ION MASS-SPECTROMETRY (SIMS) [J].

STUMPE, E ;

BENNINGHOVEN, A .

PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 1974, 21 (02) :479-486

[10]

Verbeek, 1973, ION SURFACE INTERACT

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