SURFACE-ENHANCED RAMAN-SPECTROSCOPY OF ELECTROCHEMICALLY CHARACTERIZED INTERFACES-APPLICATION TO ELECTRODE PROCESSES

被引：0
|
作者：
WEAVER, MJ [1 ]
FARQUHARSON, S [1 ]
TADAYYONI, MA [1 ]
机构：
[1] PURDUE UNIV,DEPT CHEM,W LAFAYETTE,IN 47907
来源：
ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY | 1984年 / 188卷 / AUG期
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中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
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页码：126 / COLL
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