A COMPUTER-AIDED CRYSTAL DIFFRACTION SPECTROMETER FOR PRECISION-MEASUREMENTS OF CHARACTERISTIC X-RAYS FROM HIGHLY-CHARGED HEAVY-IONS

被引：0
|
作者：
ZSCHORNACK, G
MUSIOL, G
POHL, V
REICHMANN, A
SCHIEKEL, M
机构：
[1] Sektion Physik, WB Angewandte Kernphysik, TU Dresden, Dresden, O-8027
来源：
ZEITSCHRIFT FUR PHYSIK D-ATOMS MOLECULES AND CLUSTERS | 1991年 / 21卷
关键词：
D O I：
10.1007/BF01426338
中图分类号：
O64 [物理化学（理论化学）、化学物理学]; O56 [分子物理学、原子物理学];
学科分类号：
070203 ; 070304 ; 081704 ; 1406 ;
摘要：
A computer-aided crystal diffraction spectrometer for precise X-ray spectroscopy is described. The operation principle of the spectrometer allows to use plane crystals as well as bended ones. The obtained reproducibility of diffraction reflex positions under working conditions was 2 arcsec and 4 arcsec after mechanical modifications of the spectrometer kinematics.
引用
收藏
页码：S315 / S316
页数：2
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