SPECKLE INTERFEROMETRIC METHODS OF MEASURING SMALL OUT-OF-PLANE DISPLACEMENTS

被引：14
作者：
MOHANTY, RK [1 ]
JOENATHAN, C [1 ]
SIROHI, RS [1 ]
机构：
[1] INDIAN INST TECHNOL,CTR ENGN DESIGN,MADRAS 600036,TAMIL NADU,INDIA
来源：
OPTICS LETTERS | 1984年 / 9卷 / 11期
关键词：
D O I：
10.1364/OL.9.000475
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
引用
收藏
页码：475 / 477
页数：3
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[4]   INTERFEROMETRIC DISPLACEMENT MEASUREMENT ON SCATTERING SURFACES UTILIZING SPECKLE EFFECT [J].
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