AN ULTRAHIGH-VACUUM CHAMBER FOR SURFACE X-RAY-DIFFRACTION COMBINED WITH MBE

被引:64
作者
VLIEG, E
VANTENT, A
DEJONGH, AP
NEERINGS, H
VANDERVEEN, JF
机构
关键词
D O I
10.1016/0168-9002(87)90894-1
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
引用
收藏
页码:522 / 527
页数:6
相关论文
共 15 条
[1]   THE LIQUID VAPOR INTERFACE [J].
ALSNIELSEN, J .
ZEITSCHRIFT FUR PHYSIK B-CONDENSED MATTER, 1985, 61 (04) :411-414
[2]   MODEL-INDEPENDENT STRUCTURE DETERMINATION OF THE INSB(111)2X2 SURFACE WITH USE OF SYNCHROTRON X-RAY-DIFFRACTION [J].
BOHR, J ;
FEIDENHANSL, R ;
NIELSEN, M ;
TONEY, M ;
JOHNSON, RL ;
ROBINSON, IK .
PHYSICAL REVIEW LETTERS, 1985, 54 (12) :1275-1278
[3]   A NOVEL X-RAY-SCATTERING DIFFRACTOMETER FOR STUDYING SURFACE-STRUCTURES UNDER UHV CONDITIONS [J].
BRENNAN, S ;
EISENBERGER, P .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1984, 222 (1-2) :164-167
[4]   CURRENT UNDERSTANDING AND APPLICATIONS OF THE RHEED INTENSITY OSCILLATION TECHNIQUE [J].
DOBSON, PJ ;
JOYCE, BA ;
NEAVE, JH ;
ZHANG, J .
JOURNAL OF CRYSTAL GROWTH, 1987, 81 (1-4) :1-8
[5]   X-RAY-DIFFRACTION STUDY OF THE GE(001) RECONSTRUCTED SURFACE [J].
EISENBERGER, P ;
MARRA, WC .
PHYSICAL REVIEW LETTERS, 1981, 46 (16) :1081-1084
[6]  
FEIDENHANSL R, 1986, THESIS RISO NATIONAL
[7]   APPARATUS FOR X-RAY-DIFFRACTION IN ULTRAHIGH-VACUUM [J].
FUOSS, PH ;
ROBINSON, IK .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1984, 222 (1-2) :171-176
[8]   IS THERE A FUTURE FOR LEED INTENSITIES [J].
HEINZ, K .
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1986, 41 (01) :3-19
[9]   A SYSTEM FOR MBE GROWTH AND HIGH-RESOLUTION RBS ANALYSIS [J].
MAREE, PMJ ;
DEJONGH, AP ;
DERKS, JW ;
VANDERVEEN, JF .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1987, 28 (01) :76-81
[10]  
MARRA WC, 1981, THESIS STEVENS I TEC