CHARGING-EFFECT IN AN X-RAY PHOTOELECTRON SPECTROMETER

被引：0

作者：

EBEL, MF ^{[1
]}

机构：

[1] TH VIENNA,INST TECH PHYS,VIENNA,AUSTRIA

来源：

ACTA PHYSICA AUSTRIACA | 1975年 / 41卷 / 02期

关键词：

D O I：

暂无

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

页码：125 / 132

页数：8

共 50 条

[1] EXPERIMENTS ON CHARGING EFFECT FOR ELECTRICALLY NONCONDUCTIVE SAMPLES IN X-RAY PHOTOELECTRON SPECTROMETER
EBEL, MF
VAKUUM-TECHNIK, 1974, 23 (02): : 33 - 39
[2] CHARGING EFFECT IN X-RAY PHOTOELECTRON SPECTROMETRY
EBEL, MF
EBEL, H
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1974, 3 (03) : 169 - 180
[3] ELECTRICAL CHARGING OF NON-CONDUCTORS IN A PHOTOELECTRON SPECTROMETER - EFFECT OF X-RAY SOURCE VOLTAGE
MCCREARY, JR
THORN, RJ
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1976, 8 (06) : 425 - 436
[4] SURFACE ANALYSIS WITH THE X-RAY PHOTOELECTRON SPECTROMETER
STEINHARDT, RG
SERFASS, EJ
ANALYTICAL CHEMISTRY, 1953, 25 (05) : 697 - 700
[5] ABSOLUTE CALIBRATION OF AN X-RAY PHOTOELECTRON SPECTROMETER
EBEL, MF
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1976, 8 (03) : 213 - 224
[6] X-RAY PHOTOELECTRON SPECTROMETER FOR CHEMICAL ANALYSIS
STEINHARDT, RG
SERFASS, EJ
ANALYTICAL CHEMISTRY, 1951, 23 (11) : 1585 - 1590
[7] DIFFRACTION VACUUM X-RAY PHOTOELECTRON SPECTROMETER
KOVALCHUK, MV
SHILIN, YN
DENISOV, AG
GRAVSHIN, YM
ZELTSER, IA
LYAPIN, VM
SENICHKINA, RS
INSTRUMENTS AND EXPERIMENTAL TECHNIQUES, 1987, 30 (03) : 715 - 719
[8] X-RAY PHOTOELECTRON SPECTROMETER WITH ELECTROSTATIC DEFLECTION
STEINHARDT, RG
ANALYTICAL CHEMISTRY, 1954, 26 (02) : 428 - 428
[9] ELECTRICAL CHARACTERISTICS OF AN X-RAY PHOTOELECTRON SPECTROMETER
MCGILP, JF
MAIN, IG
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1975, 6 (05) : 397 - 409
[10] X-RAY PHOTOELECTRON SPECTROMETER WITH ELECTROSTATIC DEFLECTION
STEINHARDT, RG
GRANADOS, FAD
POST, GI
ANALYTICAL CHEMISTRY, 1955, 27 (07) : 1046 - 1050

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