OXIDATION OF ALUMINUM STUDIED BY ION-SCATTERING SPECTROSCOPY (ISS) IN A SCANNING AUGER MICROSCOPE

被引：0
作者：
GAUTIER, M
DURAUD, JP
VIGOUROUX, JP
LEGRESSUS, C
SHIMIZU, R
机构：
[1] CENS,DEPT PHYS CHIM,F-91191 GIF SUR YVETTE,FRANCE
[2] OSAKA UNIV,FAC ENGN,DEPT APPL PHYS,SUITA,OSAKA 565,JAPAN
来源：
SCANNING ELECTRON MICROSCOPY | 1985年
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D O I：
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中图分类号：
TH742 [显微镜];
学科分类号：
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页码：165 / 170
页数：6
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