ANALYTICAL MODEL AND CHARACTERIZATION OF SMALL-GEOMETRY BURIED-CHANNEL DEPLETION MOSFETS

被引：6
作者：
YAMAGUCHI, T
MORIMOTO, S
机构：
来源：
IEEE JOURNAL OF SOLID-STATE CIRCUITS | 1983年 / 18卷 / 06期
关键词：
D O I：
10.1109/JSSC.1983.1052033
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
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页码：784 / 793
页数：10
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