AN XPS STUDY OF SI AS IT OCCURS IN ADSORBENTS, CATALYSTS, AND THIN-FILMS

[1] ANGEVINE PJ, 1976, 69TH ANN AICHE M CHI

[2] SURFACE-REACTIONS AND INTERDIFFUSION [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1979, 16 (05): : 1149 - 1153

[3] BAHL SK, 1974, AMORPHOUS LIQUID SEM, V1, P69

[4] ELECTRONIC-STRUCTURE OF ALUMINUM-OXIDE AS DETERMINED BY X-RAY PHOTOEMISSION [J]. PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS, 1976, 76 (02): : 689 - 694

[5] BARR TL, 1978, AM LAB, V10, P65

[6] BARR TL, 1978, AM LAB, V10, P40

[7] ESCA STUDY OF TERMINATION OF PASSIVATION OF ELEMENTAL METALS [J]. JOURNAL OF PHYSICAL CHEMISTRY, 1978, 82 (16) : 1801 - 1810

[8] CHARACTERIZATION OF INN, IN2O3, AND IN OXY-NITRIDE SEMICONDUCTING THIN-FILMS USING XPS ELECTRON-ENERGY LOSS SPECTRA [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1979, 16 (02): : 517 - 517

[9] BARR TL, 1980, SEP IT CHEM SOC MIL

[10] BARR TL, 1982, JAN ACS S CHIC

[1] ANGEVINE PJ, 1976, 69TH ANN AICHE M CHI

[2] SURFACE-REACTIONS AND INTERDIFFUSION [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1979, 16 (05): : 1149 - 1153

[3] BAHL SK, 1974, AMORPHOUS LIQUID SEM, V1, P69

[4] ELECTRONIC-STRUCTURE OF ALUMINUM-OXIDE AS DETERMINED BY X-RAY PHOTOEMISSION [J]. PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS, 1976, 76 (02): : 689 - 694

[5] BARR TL, 1978, AM LAB, V10, P65

[6] BARR TL, 1978, AM LAB, V10, P40

[7] ESCA STUDY OF TERMINATION OF PASSIVATION OF ELEMENTAL METALS [J]. JOURNAL OF PHYSICAL CHEMISTRY, 1978, 82 (16) : 1801 - 1810

[8] CHARACTERIZATION OF INN, IN2O3, AND IN OXY-NITRIDE SEMICONDUCTING THIN-FILMS USING XPS ELECTRON-ENERGY LOSS SPECTRA [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1979, 16 (02): : 517 - 517

[9] BARR TL, 1980, SEP IT CHEM SOC MIL

[10] BARR TL, 1982, JAN ACS S CHIC