HREM CHARACTERIZATION OF INTERFACES IN THIN MOCVD SUPERCONDUCTING FILMS

被引：2
|
作者：
DORIGNAC, D
SCHAMM, S
GRIGIS, C
SANTISO, J
GARCIA, G
FIGUERAS, A
机构：
[1] CSIC, ICMAB, E-08193 BARCELONA, SPAIN
[2] SE CARBUROS METALICOS, E-08038 BARCELONA, SPAIN
来源：
JOURNAL DE PHYSIQUE IV | 1995年 / 5卷 / C5期
关键词：
D O I：
10.1051/jphyscol:19955110
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
This paper is concerned with high-T-c superconducting compounds produced by metal-organic chemical vapour deposition. The nanostructure of different types of interfaces yttria stabilized zirconia buffer/(1-102)-sapphire substrate, YBa2Cu3O7-x film/Y2O3 precipitates as well as YBa2Cu3O7-x film/(001)-NdGaO3, SrTiO3, and -MgO substrates - has been investigated by high resolution electron microscopy. The orientation relationships and the corresponding layer sequences across the interfaces have been determined with the aid of computer simulations.
引用
收藏
页码：927 / 934
页数：8
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