UNDERSTANDING THIN-FILM X-RAY-SPECTRA

被引：20
作者：
CHAPMAN, JN
NICHOLSON, WAP
CROZIER, PA
机构：
来源：
JOURNAL OF MICROSCOPY-OXFORD | 1984年 / 136卷 / NOV期
关键词：
D O I：
10.1111/j.1365-2818.1984.tb00527.x
中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
引用
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页码：179 / 191
页数：13
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