OBTAINING QUANTITATIVE INFORMATION ON AMORPHOUS LAYER THICKNESS ON CRYSTAL-SURFACE USING X-RAY-DIFFRACTION UNDER SPECULAR REFLECTION CONDITIONS

被引：26
作者：
GOLOVIN, AL
IMAMOV, RM
机构：
来源：
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH | 1983年 / 80卷 / 01期
关键词：
D O I：
10.1002/pssa.2210800161
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
引用
收藏
页码：K63 / K65
页数：3
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GOLOVIN, AL ;
IMAMOV, RM .
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1983, 77 (01) :K91-K94
[3]   X-RAY TOTAL-EXTERNAL-REFLECTION-BRAGG DIFFRACTION - STRUCTURAL STUDY OF THE GAAS-AL INTERFACE [J].
MARRA, WC ;
EISENBERGER, P ;
CHO, AY .
JOURNAL OF APPLIED PHYSICS, 1979, 50 (11) :6927-6933
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