ANALYSIS OF CHANGE IN NICR THIN-FILMS COMPOSITION BY AES METHOD

被引：0
|
作者：
HANUSOVSZKY, A [1 ]
机构：
[1] IND RES INST ELECTR HIKI,H-1393 BUDAPEST,HUNGARY
来源：
VACUUM | 1983年 / 33卷 / 1-2期
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中图分类号：
T [工业技术];
学科分类号：
08 ;
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页码：131 / 131
页数：1
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