CHANGES IN THE CRYSTAL-STRUCTURE OF RF-MAGNETRON SPUTTERED BATIO3 THIN-FILMS

被引:0
作者
UCHINO, K
LEE, NY
TOBA, T
USUKI, N
ABURATANI, H
ITO, Y
机构
来源
NIPPON SERAMIKKUSU KYOKAI GAKUJUTSU RONBUNSHI-JOURNAL OF THE CERAMIC SOCIETY OF JAPAN | 1992年 / 100卷 / 09期
关键词
RF-MAGNETRON SPUTTERING; BATIO3 THIN FILM; ANNEALING PROCESS; CRITICAL GRAIN SIZE; PHASE TRANSITION;
D O I
暂无
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
The crystal structure of BaTiO3 thin films fabricated by RF-magnetron sputtering has been investigated. As-sputtered films exhibited a cubic structure with a small grain size of about 6-8nm. After annealing at a temperature above 1100-degrees-C, the crystal structure changed from cubic to tetragonal, because the annealing process caused grain growth. The critical grain size of the thin films which provided the cubic structure existed in the range of 0.1-0.2-mu-m. This value agreed well with the critical grain size of BaTiO3 fine particles, 0.12-mu-m.
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页码:1091 / 1093
页数:3
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