PRECISE LATTICE-PARAMETER DETERMINATION OF DISLOCATION-FREE GALLIUM-ARSENIDE .1. X-RAY MEASUREMENTS

被引：33

作者：

BAKER, JFC

HART, M

HALLIWELL, MAG

HECKINGBOTTOM, R

机构：

[1] UNIV BRISTOL,DEPT PHYS,TYNDALL AVE,BRISTOL BS8 1TL,ENGLAND

[2] PO RES DEPT,MARTLESHAM HEATH,IPSWICH IPS 7RE,ENGLAND

来源：

SOLID-STATE ELECTRONICS | 1976年 / 19卷 / 04期

关键词：

D O I：

10.1016/0038-1101(76)90031-9

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：331 / &

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[9]

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[10] HIGH PRECISION LATTICE PARAMETER MEASUREMENTS BY MULTIPLE BRAGG REFLEXION DIFFRACTOMETRY [J].

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PROCEEDINGS OF THE ROYAL SOCIETY OF LONDON SERIES A-MATHEMATICAL AND PHYSICAL SCIENCES, 1969, 309 (1497) :281-&

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