EXPERIMENTAL REQUIREMENTS FOR ACCURATE X-RAY INTENSITY MEASUREMENTS BY PHOTOGRAPIC MEANS

被引:8
作者
JEFFERY, JW
WHITAKER, A
机构
关键词
D O I
10.1107/S0365110X65004723
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
引用
收藏
页码:963 / &
相关论文
共 17 条
[1]   MAKING SMALL SPHERES [J].
BOND, WL .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1951, 22 (05) :344-345
[2]   THE REQUIRED PRECISION OF INTENSITY MEASUREMENTS FOR SINGLE-CRYSTAL ANALYSIS [J].
CRUICKSHANK, DWJ .
ACTA CRYSTALLOGRAPHICA, 1960, 13 (10) :774-777
[3]   STRUCTURE OF A SILICON CARBIDE POLYTYPE 24R [J].
HAMILTON, WC ;
ROLLETT, JS ;
SPARKS, RA .
ACTA CRYSTALLOGRAPHICA, 1965, 18 :129-&
[4]  
HENRY NFM, 1960, INTERPRETATION XRAY, P112
[5]   A SIMPLE PHOTOMETER FOR MEASURING OPTICAL DENSITY OF INTEGRATING WEISSENBERG REFLECTIONS [J].
JEFFERY, JW .
JOURNAL OF SCIENTIFIC INSTRUMENTS, 1963, 40 (10) :494-&
[6]   ABSORPTION + OTHER ERRORS IN MEASUREMENT OF INTENSITIES OF X-RAY REFLEXIONS FROM SINGLE CRYSTALS [J].
JEFFERY, JW ;
ROSE, KM .
ACTA CRYSTALLOGRAPHICA, 1964, 17 (04) :343-&
[7]  
MACGILLAVRY CH, 1964, PRIVATE COMMUNICATIO
[8]  
MAMMI M, 1963, ACTA CRYSTALLOGR, V16, pA149
[9]   A SECOND COMPARISON OF VARIOUS COMMERCIALLY AVAILABLE X-RAY FILMS [J].
MORIMOTO, H ;
UYEDA, R .
ACTA CRYSTALLOGRAPHICA, 1963, 16 (11) :1107-&
[10]   METHOD FOR CUTTING AND SHAPING FRAGILE CRYSTALS [J].
PEPINSKY, R .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1953, 24 (05) :403-403