PEAK BROADENING CAUSED BY A 5TH-ORDER ABERRATION IN THE FRINGING FIELD OF AN ELECTROSTATIC ANALYZER

被引：3
作者：
ISHIHARA, M
机构：
[1] Analytical Instruments Division, JEOL Ltd., 196, 3-1-2 Musashino, Akishima, Toktyo
来源：
INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES | 1991年 / 105卷 / 01期
关键词：
D O I：
10.1016/0168-1176(91)85084-Y
中图分类号：
O64 [物理化学（理论化学）、化学物理学]; O56 [分子物理学、原子物理学];
学科分类号：
070203 ; 070304 ; 081704 ; 1406 ;
摘要：
Ion optical effects of the fringing field of an electrostatic analyzer up to the seventh order were studied by a ray tracing method. It was observed that the fifth-order effect is most important in the effects higher than third order. This fifth-order effect is represented by a fringing field integral. The image aberration caused by this effect is discussed.
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页码：1 / 12
页数：12
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