IDENTIFICATION OF THE MIGRATION PATH OF INTERSTITIAL CARBON IN SILICON

被引:30
作者
CAPAZ, RB [1 ]
DALPINO, A [1 ]
JOANNOPOULOS, JD [1 ]
机构
[1] INST TECNOL AERONAUT, BR-12228 SAO PAULO, BRAZIL
关键词
D O I
10.1103/PhysRevB.50.7439
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We have performed ab initio total-energy calculations of ground-state properties and migration paths of interstitial carbon in silicon. The ground state involves threefold-coordinated carbon and silicon atoms and its geometry suggests primarily p and sp bonding for carbon, rather than sp(2) one would naively expect. Examination of possible migration paths reveals that only three correspond to small ''jumps'' involving a single ''bond breaking.'' Of these, we predict that only one has a barrier of considerably lower energy (similar to 0.5 eV) and involves an intermediate ''saddle-point'' configuration of C-2 symmetry.
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页码:7439 / 7442
页数:4
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