THE PHOTOFIELD EFFECT IN A-SI-H THIN-FILM MOS-TRANSISTORS - THEORY AND MEASUREMENT

被引：11
作者：
HARM, AO
SCHROPP, REI
VERWEY, JF
机构：
来源：
PHILOSOPHICAL MAGAZINE B-PHYSICS OF CONDENSED MATTER STATISTICAL MECHANICS ELECTRONIC OPTICAL AND MAGNETIC PROPERTIES | 1985年 / 52卷 / 01期
关键词：
D O I：
10.1080/13642818508243165
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
引用
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页码：59 / 70
页数：12
相关论文
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