PRODUCTION, PROPERTIES AND USE OF ANODE OXIDE-FILMS ON AIIIBV SEMICONDUCTORS

被引:0
作者
SOROKIN, IN
机构
来源
IZVESTIYA VYSSHIKH UCHEBNYKH ZAVEDENII KHIMIYA I KHIMICHESKAYA TEKHNOLOGIYA | 1982年 / 25卷 / 05期
关键词
D O I
暂无
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
引用
收藏
页码:588 / 593
页数:6
相关论文
共 50 条
[41]   STRUCTURE AND OPTICAL-PROPERTIES OF TIN OXIDE-FILMS [J].
DEMIRYONT, H ;
NIETERING, KE .
SOLAR ENERGY MATERIALS, 1989, 19 (1-2) :79-94
[42]   MOSSBAUER SPECTROSCOPIC INVESTIGATION OF PROPERTIES OF THIN OXIDE-FILMS [J].
SUZDALEV, IP ;
AMULYAVI.AP .
ZHURNAL EKSPERIMENTALNOI I TEORETICHESKOI FIZIKI, 1972, 63 (05) :1758-&
[43]   PROPERTIES OF THIN ANODIC OXIDE-FILMS ON ZIRCONIUM ALLOYS [J].
COX, B ;
GASCOIN, F ;
WONG, YM .
JOURNAL OF NUCLEAR MATERIALS, 1995, 218 (02) :113-128
[44]   BREAKDOWN VOLTAGE AND PROTECTIVE PROPERTIES OF OXIDE-FILMS ON TITANIUM [J].
SAVOCHKIN, VR ;
NAGAI, IN .
PROTECTION OF METALS, 1981, 17 (03) :256-258
[45]   DIELECTRIC-PROPERTIES OF ANODIC OXIDE-FILMS ON TANTALUM [J].
KERREC, O ;
DEVILLIERS, D ;
GROULT, H ;
CHEMLA, M .
ELECTROCHIMICA ACTA, 1995, 40 (06) :719-724
[46]   ELECTROCATALYTIC PROPERTIES OF ION-IMPLANTED OXIDE-FILMS [J].
ELFENTHAL, L ;
PATZELT, T ;
SCHULTZE, JW ;
MEYER, O .
MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING, 1989, 116 :71-77
[47]   STRUCTURAL DEPENDENCE OF THE EMISSIVE PROPERTIES OF BARIUM OXIDE-FILMS [J].
KIRSANOVA, TS ;
TUMAREVA, TA ;
GANDELMAN, SG .
IZVESTIYA AKADEMII NAUK SSSR SERIYA FIZICHESKAYA, 1979, 43 (03) :497-499
[48]   SEMICONDUCTING AND ELECTROCATALYTIC PROPERTIES OF SPUTTERED COBALT OXIDE-FILMS [J].
SCHUMACHER, LC ;
HOLZHUETER, IB ;
HILL, IR ;
DIGNAM, MJ .
ELECTROCHIMICA ACTA, 1990, 35 (06) :975-984
[49]   DIELECTRIC AND OPTICAL-PROPERTIES OF EUROPIUM OXIDE-FILMS [J].
JAYARAJ, MK ;
VALLABHAN, CPG .
THIN SOLID FILMS, 1989, 177 :59-67
[50]   OPTICAL-PROPERTIES OF TANTALUM OXIDE-FILMS ON SILICON [J].
REVESZ, AG ;
REYNOLDS, JH ;
ALLISON, JF .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1976, 123 (06) :889-894