1/F NOISE IN METAL CONTACTS AND ANTIGRANULOCYTES RESISTORS

被引:6
作者
TAKAGI, K
MIZUNAMI, T
SUZUKI, JI
MASUDA, S
机构
[1] Kyushu Inst of Technology, Dep of, Electronics, Kitakyushu, Jpn, Kyushu Inst of Technology, Dep of Electronics, Kitakyushu, Jpn
来源
IEEE TRANSACTIONS ON COMPONENTS HYBRIDS AND MANUFACTURING TECHNOLOGY | 1986年 / 9卷 / 02期
关键词
ELECTRIC CONTACTS - RESISTORS - Thick Films - SOLID STATE DEVICES; THICK FILM - Measurements;
D O I
10.1109/TCHMT.1986.1136638
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
To measure the current noise in metal contacts and granular resistors, a noise-measuring system with a switched-capacitor filter was used. The samples were crossbar contacts and graphite thick-film resistors. All noise spectra were of the 1/f type. The noise of crossbar contacts and thick-film resistors increases in proportion to the fifth and third power of the resistance, respectively. A model for the noise of metal contacts and granular resistors is proposed. It is based on the spontaneous fluctuation of temperature of the small conducting spots between metal surfaces and granular boundaries, respectively. The results of the analysis are in qualitative agreement with measurements.
引用
收藏
页码:141 / 144
页数:4
相关论文
共 4 条
[1]  
HOLM R, 1979, ELECTRIC CONTACTS, P1
[2]  
HOOGE FN, 1977, P S 1 F FLUCTUATIONS, P88
[3]  
Musha T., 1977, Oyo Buturi, V46, P1144
[4]  
VANDERZIEL A, 1976, NOISE MEASUREMENTS, P46