EFFECT OF THE PHASE-SHIFT DUE TO DYNAMICAL SCATTERING ON THE CONTRAST OF CRYSTAL-STRUCTURE IMAGES

被引:18
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HORIUCHI, S
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10.1016/0304-3991(82)90043-2
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TH742 [显微镜];
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页码:229 / 235
页数:7
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共 20 条
[1]   MULTIPLE PHASE FORMATION IN BINARY SYSTEM NB2O5-WO3 .6. ELECTRON MICROSCOPIC OBSERVATION AND EVALUATION OF NON-PERIODIC SHEAR STRUCTURES [J].
ALLPRESS, JG ;
SANDERS, JV ;
WADSLEY, AD .
ACTA CRYSTALLOGRAPHICA SECTION B-STRUCTURAL CRYSTALLOGRAPHY AND CRYSTAL CHEMISTRY, 1969, B 25 :1156-&
[2]   ATOMIC RESOLUTION WITH A 600-KV ELECTRON-MICROSCOPE [J].
COSSLETT, VE ;
CAMPS, RA ;
SAXTON, WO ;
SMITH, DJ ;
NIXON, WC ;
AHMED, H ;
CATTO, CJD ;
CLEAVER, JRA ;
SMITH, KCA ;
TIMBS, AE ;
TURNER, PW ;
ROSS, PM .
NATURE, 1979, 281 (5726) :49-51
[3]   ELECTRON-MICROSCOPE IMAGE CONTRAST FOR THIN CRYSTALS [J].
COWLEY, JM ;
IIJMA, S .
ZEITSCHRIFT FUR NATURFORSCHUNG PART A-ASTROPHYSIK PHYSIK UND PHYSIKALISCHE CHEMIE, 1972, A 27 (03) :445-+
[4]   THE SCATTERING OF ELECTRONS BY ATOMS AND CRYSTALS .1. A NEW THEORETICAL APPROACH [J].
COWLEY, JM ;
MOODIE, AF .
ACTA CRYSTALLOGRAPHICA, 1957, 10 (10) :609-619
[5]   IMAGING OF SINGLE ATOMS WITH ELECTRON MICROSCOPE BY PHASE CONTRAST [J].
EISENHANDLER, CB ;
SIEGEL, BM .
JOURNAL OF APPLIED PHYSICS, 1966, 37 (04) :1613-+
[6]   APPROXIMATIONS FOR CALCULATION OF HIGH-RESOLUTION ELECTRON-MICROSCOPE IMAGES OF THIN-FILMS [J].
FEJES, PL .
ACTA CRYSTALLOGRAPHICA SECTION A, 1977, 33 (JAN1) :109-&
[7]  
FRANK J, 1973, OPTIK, V38, P519
[8]  
HEIDENREICH RD, 1964, FUNDAMENTALS TRANSMI, P140
[9]   HIGH-RESOLUTION LATTICE IMAGE OF NB12O29 BY MEANS OF A HIGH-VOLTAGE ELECTRON-MICROSCOPE NEWLY CONSTRUCTED [J].
HORIUCHI, S ;
MATSUI, Y ;
BANDO, Y .
JAPANESE JOURNAL OF APPLIED PHYSICS, 1976, 15 (12) :2483-2484