ATOMIC FORCE AND SCANNING TUNNEL MICROSCOPY STUDY OF LANGMUIR-BLODGETT-FILMS OF LIQUID-CRYSTAL CREST-LIKE POLYMER - MOLECULAR LATTICE, INDUCED CONDUCTION AND CHARGE SUPERSTRUCTURE

The methods of scanning tunnel microscopy (STM), scanning tunnel spectroscopy (STS) and atomic strength microscopy (ASM) are employed to study the films of Langmuir - Bloget liquid crystal crest-like polymer. From the ASM images the structure of the molecular surface lattice of a film double layer is determined. With the use of STS and STM procedures the tunneling conduction induced by the tunnel microscope point and enabling to observe the atomic structure of a graphite substrate under of the film layer of the about 66 angstrom thickness is found. In the current mode of the film surface STM image the superstructure depending on the tunnel voltage sign and indicating the existence of the distributed surface CDW-like charge is found. The models of the effects observed are proposed and discussed.