HGCDTE-CR INTERFACE CHEMISTRY

被引：33

作者：

PETERMAN, DJ ^{[1
]}

FRANCIOSI, A ^{[1
]}

机构：

[1] UNIV MINNESOTA,DEPT CHEM ENGN & MAT SCI,MINNEAPOLIS,MN 55455

来源：

APPLIED PHYSICS LETTERS | 1984年 / 45卷 / 12期

关键词：

D O I：

10.1063/1.95128

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：1305 / 1306

页数：2

共 12 条

[1] CHANGES IN THE LOCAL CHEMICAL-COMPOSITION DURING THE HG1-XCDXTE-AL INTERFACE FORMATION [J].

DANIELS, RR ;

MARGARITONDO, G ;

DAVIS, GD ;

BYER, NE .

APPLIED PHYSICS LETTERS, 1983, 42 (01) :50-52

[2] INTERACTION OF THIN-LAYERS OF AL AND GE WITH CLEAVED (HG,CD)TE SURFACES [J].

DAVIS, GD ;

BYER, NE ;

DANIELS, RR ;

MARGARITONDO, G .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1983, 1 (03) :1726-1729

[3] DEPOSITION OF AU OVERLAYERS ONTO CLEAVED (HG,CD)TE SURFACES [J].

DAVIS, GD ;

BECK, WA ;

BYER, NE ;

DANIELS, RR ;

MARGARITONDO, G .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1984, 2 (02) :546-550

[4] PROBING DEPTH IN PHOTOEMISSION AND AUGER-ELECTRON SPECTROSCOPY [J].

LINDAU, I ;

SPICER, WE .

JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA, 1974, 3 (05) :409-413

[5]

Mills K.C., 1974, THERMODYNAMIC DATA I

[6] OXIDATION OF HG1-XCDXTE STUDIED WITH SURFACE SENSITIVE TECHNIQUES [J].

MORGEN, P ;

SILBERMAN, JA ;

LINDAU, I ;

SPICER, WE ;

WILSON, JA .

JOURNAL OF ELECTRONIC MATERIALS, 1982, 11 (04) :597-610

[7] METAL CDTE INTERFACES [J].

PATTERSON, MH ;

WILLIAMS, RH .

JOURNAL OF CRYSTAL GROWTH, 1982, 59 (1-2) :281-288

[8]

PETERMAN DJ, UNPUB

[9] EVIDENCE OF STRESS-MEDIATED HG MIGRATION IN HG1-XCDXTE [J].

RACCAH, PM ;

LEE, U ;

SILBERMAN, JA ;

SPICER, WE ;

WILSON, JA .

APPLIED PHYSICS LETTERS, 1983, 42 (04) :374-376

[10] COMPARATIVE STUDIES OF MERCURY CADMIUM TELLURIDE SINGLE-CRYSTAL AND EPITAXIAL [J].

RACCAH, PM ;

LEE, U .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1983, 1 (03) :1587-1592

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