WORST-CASE STATIC NOISE MARGIN CRITERIA FOR LOGIC-CIRCUITS AND THEIR MATHEMATICAL EQUIVALENCE

被引：129
作者：
LOHSTROH, J [1 ]
SEEVINCK, E [1 ]
DEGROOT, J [1 ]
机构：
[1] CSIR,NATL ELECT ENGN RES INST,PRETORIA,SOUTH AFRICA
来源：
IEEE JOURNAL OF SOLID-STATE CIRCUITS | 1983年 / 18卷 / 06期
关键词：
D O I：
10.1109/JSSC.1983.1052035
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：803 / 807
页数：5
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