A DESCRIPTION OF THE BELL-LABORATORIES SCANNED ACOUSTIC MICROSCOPE

被引:1
作者
SULEWSKI, P [1 ]
BISHOP, DJ [1 ]
DYNES, RC [1 ]
机构
[1] BELL TEL LABS INC, MURRAY HILL, NJ 07974 USA
来源
BELL SYSTEM TECHNICAL JOURNAL | 1982年 / 61卷 / 09期
关键词
D O I
10.1002/j.1538-7305.1982.tb03419.x
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:2167 / 2183
页数:17
相关论文
共 50 条
  • [41] Diversity and excellence: A Bell Laboratories choice
    Mitchell, James W.
    ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 2006, 231
  • [42] OPTICS AT BELL LABORATORIES - LASERS IN TECHNOLOGY
    KOGELNIK, HW
    APPLIED OPTICS, 1972, 11 (11) : 2426 - +
  • [43] OPTICS AT BELL LABORATORIES - LASERS IN SCIENCE
    GIORDMAINE, JA
    APPLIED OPTICS, 1972, 11 (11) : 2435 - +
  • [44] A SCANNED SOURCE-X-RAY MICROSCOPE
    MICHETTE, AG
    FEDOSEJEVS, R
    PFAUNTSCH, SJ
    BOBKOWSKI, R
    MEASUREMENT SCIENCE AND TECHNOLOGY, 1994, 5 (05) : 555 - 559
  • [45] DEPTH DISCRIMINATION IN SCANNED HETERODYNE MICROSCOPE SYSTEMS
    SOMEKH, MG
    JOURNAL OF MICROSCOPY-OXFORD, 1992, 168 : 131 - 151
  • [46] SCANNED-LASER MICROSCOPE FOR PHOTOLUMINESCENCE STUDIES
    BLACK, JF
    SHERMAN, B
    SUMMERS, CJ
    APPLIED OPTICS, 1972, 11 (07): : 1553 - &
  • [47] SCANNED-CANTILEVER ATOMIC FORCE MICROSCOPE
    BASELT, DR
    BALDESCHWIELER, JD
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1993, 64 (04) : 908 - 911
  • [48] ACOUSTIC MICROSCOPE
    HLINA, J
    CESKOSLOVENSKY CASOPIS PRO FYSIKU SEKCE A, 1974, 24 (01): : 79 - 80
  • [49] THE ACOUSTIC MICROSCOPE
    ATTAL, J
    RECHERCHE, 1983, 14 (144): : 664 - 667
  • [50] MOTION EFFECTS IN SCANNED ACOUSTIC HOLOGRAPHY
    COELLOVERA, AE
    SCHLUSSLER, L
    FONTANA, JR
    WADE, G
    IEEE TRANSACTIONS ON SONICS AND ULTRASONICS, 1978, 25 (04): : 167 - 176