QUALITY ASSURANCE SYSTEM AND RELIABILITY TESTING OF LSI CIRCUITS

被引：2
|
作者：
WURNIK, FM
机构：
来源：
MICROELECTRONICS AND RELIABILITY | 1983年 / 23卷 / 04期
关键词：
D O I：
10.1016/0026-2714(83)91159-9
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：709 / 715
页数：7
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