TSC STUDIES OF CARRIER TRAPPING IN ELECTRON-IRRADIATED AND GAMMA-IRRADIATED TEFLON

被引：51

作者：

GROSS, B ^{[1
]}

SESSLER, GM ^{[1
]}

WEST, JE ^{[1
]}

机构：

[1] BELL TEL LABS INC,MURRAY HILL,NJ 07974

来源：

JOURNAL OF APPLIED PHYSICS | 1976年 / 47卷 / 03期

关键词：

D O I：

10.1063/1.322688

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：968 / 975

页数：8

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