ELECTRIC FIELD STRENGTHS AT TOTALLY REFLECTING INTERFACES

被引：219

作者：

HARRICK, NJ

机构：

来源：

JOURNAL OF THE OPTICAL SOCIETY OF AMERICA | 1965年 / 55卷 / 07期

关键词：

D O I：

10.1364/JOSA.55.000851

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

引用

页码：851 / &

共 13 条

[1] SURFACE STUDIES BY SPECTRAL ANALYSIS OF INTERNALLY REFLECTED INFRARED RADIATION - HYDROGEN ON SILICON [J].

BECKER, GE ;

GOBELI, GW .

JOURNAL OF CHEMICAL PHYSICS, 1963, 38 (12) :2942-&

[2] ON THE DETERMINATION OF OPTICAL CONSTANTS IN THE INFRARED BY ATTENUATED TOTAL REFLECTION [J].

FAHRENFORT, J ;

VISSER, WM .

SPECTROCHIMICA ACTA, 1962, 18 (09) :1103-&

[3] INFRARED SPECTRA OF MONOLAYERS ON METAL MIRRORS [J].

FRANCIS, SA ;

ELLISON, AH .

JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1959, 49 (02) :131-138

[4]

GOOS F, 1949, ANN PHYS-BERLIN, V5, P251

[5] *EIN NEUER UND FUNDAMENTALER VERSUCH ZUR TOTALREFLEXION [J].

GOOS, F ;

HANCHEN, H .

ANNALEN DER PHYSIK, 1947, 1 (7-8) :333-346

[6] SEMICONDUCTOR SURFACE PROPERTIES DEDUCED FROM FREE CARRIER ABSORPTION AND REFLECTION OF INFRARED RADIATION [J].

HARRICK, NJ .

JOURNAL OF PHYSICS AND CHEMISTRY OF SOLIDS, 1960, 14 :60-71

[7]

HARRICK NJ, 1963, ANN NY ACAD SCI, V101, P928

[8] OPTICAL SPECTRUM OF SEMICONDUCTOR SURFACE STATES FROM FRUSTRATED TOTAL INTERNAL REFLECTIONS [J].

HARRICK, NJ .

PHYSICAL REVIEW, 1962, 125 (04) :1165-&

[9] STUDY OF PHYSICS AND CHEMISTRY OF SURFACES FROM FRUSTRATED TOTAL INTERNAL REFLECTIONS [J].

HARRICK, NJ .

PHYSICAL REVIEW LETTERS, 1960, 4 (05) :224-226

[10] CROSSED-PLATE INFRARED POLARIZER [J].

HARRICK, NJ .

JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1964, 54 (10) :1281-&

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