X-RAY MICROSCOPY IN POLYMER SCIENCE - PROSPECTS OF A NEW IMAGING TECHNIQUE

被引：47
作者：
ADE, H
SMITH, AP
CAMERON, S
CIESLINSKI, R
MITCHELL, G
HSIAO, B
RIGHTOR, E
机构：
[1] EXXON RES & ENGN CO,ANNANDALE,NJ 08801
[2] DUPONT CO INC,EXPTL STN,MIDLAND,MI 48667
[3] DOW CHEM CO USA,TEXAS POLYMER CTR,FREEPORT,TX 77541
来源：
POLYMER | 1995年 / 36卷 / 09期
基金：
美国国家科学基金会;
关键词：
X-RAY MICROSCOPY; STXM; BULK CHARACTERISTICS;
D O I：
10.1016/0032-3861(95)90930-Z
中图分类号：
O63 [高分子化学（高聚物）];
学科分类号：
070305 ; 080501 ; 081704 ;
摘要：
A relatively non-invasive imaging technique, which employs highly focused, tunable X-rays, is described. This technique-scanning transmission X-ray microscopy-can be used to investigate the bulk characteristics of polymeric materials with chemical sensitivity at a spatial resolution of about 50 nm. We present examples ranging from unoriented multiplase polymers to highly oriented Kevlar fibres. In the case of oriented samples, a dichroism technique is used to determine the orientation of specific chemical bonds. Extension of the technique to investigate surfaces of bulk samples is discussed.
引用
收藏
页码：1843 / 1848
页数：6
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