PHOTODIODE NONLINEARITY MEASUREMENT WITH AN INTENSITY STABILIZED LASER AS A RADIATION SOURCE

被引：38
|
作者：
FISCHER, J
FU, L
机构：
[1] Physikalisch-Technische Bundesanstalt, Institut Berlin, Berlin, 1000
来源：
APPLIED OPTICS | 1993年 / 32卷 / 22期
关键词：
RADIOMETRY; NONLINEARITY OF PHOTODIODES;
D O I：
10.1364/AO.32.004187
中图分类号：
O43 [光学];
学科分类号：
070207 ; 0803 ;
摘要：
A new facility for the nonlinearity measurement of the spectral responsivity of photodiodes has been developed by using an intensity stabilized laser as radiation source. This device enables an automated measurement of the photodiode nonlinearity from the nanowatt to the milliwatt radiant power range at wavelengths between 250 and 800 nm with uncertainties of better than 0.01% in the visible and better than 0.05% in the UV at the 1sigma level.
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页码：4187 / 4190
页数：4
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