X-RAY-DIFFRACTION STUDIES OF CATALYSTS

被引：25
|
作者：
COHEN, JB
机构：
[1] Department of Materials Science and Engineering, The Robert R. McCormick School of Engineering and Applied Science, The Technological Institute, Evanston
来源：
ULTRAMICROSCOPY | 1990年 / 34卷 / 1-2期
基金：
美国国家科学基金会;
关键词：
D O I：
10.1016/0304-3991(90)90055-Q
中图分类号：
TH742 [显微镜];
学科分类号：
摘要：
With the new high-intensity X-ray sources, by using anomalous scattering and glancing incidence, it is now possible to obtain considerable statistical information on catalysts-supported metals (size distribution and perfection), micron-sized single-crystal particles (structure), and the nature of surfaces. Examples of work on catalyst materials is given to illustrate these possibilities. © 1990.
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页码：41 / 46
页数：6
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