OBJECTIVE LENS OF ELECTRON-MICROSCOPE FOR OBSERVING FERROMAGNETIC MATERIALS

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作者：

TSUNO, K ^{[1
]}

机构：

[1] JEOL LTD,TOKYO 196,JAPAN

来源：

JOURNAL OF ELECTRON MICROSCOPY | 1983年 / 32卷 / 03期

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TH742 [显微镜];

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页码：282 / 282

页数：1

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