OPERATIONAL CHARACTERISTICS OF A RADIAL EXTRACTION ION-SOURCE WITH AN INJECTED ELECTRON-BEAM

被引:4
|
作者
ABDELAZIZ, M
ABDELBAKI, M
ZAKHARY, S
机构
关键词
D O I
10.1109/TNS.1983.4332927
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
引用
收藏
页码:2699 / 2701
页数:3
相关论文
共 50 条
  • [41] PULSED CRYOGENIC ION-SOURCE FOR PURE BEAM EXTRACTION
    KASUYA, K
    HORIOKA, K
    TAKAHASHI, T
    YONEDA, H
    KUWABARA, H
    IEEE TRANSACTIONS ON PLASMA SCIENCE, 1985, 13 (05) : 327 - 330
  • [42] EFFICIENCY MEASUREMENTS FOR A LOW CHARGE-STATE IONIC INJECTION INTO AN ELECTRON-BEAM ION-SOURCE
    VISENTIN, B
    VANDUPPEN, P
    LEROY, PA
    HARRAULT, F
    GOBIN, R
    NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 1995, 101 (03): : 275 - 279
  • [43] OPTIMIZATION OF INTERMEDIATE CHARGE-STATE OUTPUT FROM ELECTRON-BEAM ION-SOURCE DEVICES
    HERSHCOVITCH, A
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1994, 65 (04): : 1075 - 1077
  • [44] A SIMULATION STUDY OF RADIAL EXPANSION OF AN ELECTRON-BEAM INJECTED INTO AN IONOSPHERIC PLASMA
    KOGA, J
    LIN, CS
    JOURNAL OF GEOPHYSICAL RESEARCH-SPACE PHYSICS, 1994, 99 (A3) : 3971 - 3983
  • [45] DISCHARGE AND ION EXTRACTION PROPERTIES OF A BEAM-PLASMA ION-SOURCE
    ROSING, MG
    CONRAD, JR
    JOURNAL OF APPLIED PHYSICS, 1985, 57 (03) : 816 - 818
  • [46] OPERATIONAL CHARACTERISTICS OF 2-STAGE DISCHARGE ION-SOURCE
    NAITO, M
    MURASE, K
    NAKASHIMA, Y
    NUNOGAKI, M
    AKIMUNE, H
    JAPANESE JOURNAL OF APPLIED PHYSICS, 1980, 19 (02) : 337 - 344
  • [47] Electron-beam extraction system for the Frankfurt 14 GHz electron cyclotron resonance ion source
    Runkel, S
    Hohn, O
    Schmidt, L
    Stiebing, KE
    Schmidt-Bocking, H
    Schempp, A
    Becker, R
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1998, 69 (02): : 721 - 723
  • [48] Electron-beam extraction system for the Frankfurt 14 GHz electron cyclotron resonance ion source
    Runkel, S.
    Hohn, O.
    Schmidt, L.
    Stiebing, K.E.
    Schmidt-Bocking, H.
    Schempp, A.
    Becker, R.
    Review of Scientific Instruments, 1998, 69 (2 pt 2):
  • [49] CONCENTRATION ENRICHMENT IN THE ION-SOURCE OF A PULSED ELECTRON-BEAM HIGH-PRESSURE MASS-SPECTROMETER
    MCGREW, DS
    KNIGHTON, WB
    BOGNAR, JA
    GRIMSRUD, EP
    INTERNATIONAL JOURNAL OF MASS SPECTROMETRY AND ION PROCESSES, 1994, 139 : 47 - 58
  • [50] The electron-beam plasma ion source as source of negative fluorine
    Alton, GD
    Welton, RF
    Murray, SN
    Cui, B
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1998, 69 (03): : 1327 - 1331