GEXSI1-X STRAINED-LAYER HETEROSTRUCTURE BIPOLAR-TRANSISTORS

被引:74
|
作者
TEMKIN, H
BEAN, JC
ANTREASYAN, A
LEIBENGUTH, R
机构
关键词
D O I
10.1063/1.99220
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
收藏
页码:1089 / 1091
页数:3
相关论文
共 50 条
  • [21] THE STRUCTURE OF GEXSI1-X/SI STRAINED LAYER SUPERLATTICES AND HETEROSTRUCTURES
    ZHANG, R
    ZHENG, YD
    JIANG, RL
    HU, LQ
    ZHONG, PX
    YU, SD
    LI, Q
    FENG, D
    CHEN, GX
    APPLIED SURFACE SCIENCE, 1991, 48-9 : 356 - 360
  • [22] Double crystal X-ray diffraction study of GexSi1-x/Si strained-layer superlattices by kinematical approach
    Duan, Xiaofeng
    Feng, Guoguang
    Wang, Yutian
    Chu, Yiming
    Liu, Xuefeng
    Sheng, Chi
    Zhou, Guoliang
    Pan Tao Ti Hsueh Pao/Chinese Journal of Semiconductors, 1992, 13 (01): : 14 - 21
  • [23] KINEMATICAL STUDY OF GEXSI1-X/SI STRAINED-LAYER SUPERLATTICE BY A DOUBLE CRYSTAL X-RAY-DIFFRACTION METHOD
    DUAN, XF
    WANG, YT
    SHENG, C
    OUYANG, JT
    PHILOSOPHICAL MAGAZINE LETTERS, 1993, 67 (01) : 1 - 7
  • [24] X-RAY AND TRANSMISSION ELECTRON-MICROSCOPY ANALYSIS OF IMPERFECT GEXSI1-X/SI STRAINED-LAYER SUPERLATTICES
    LI, JH
    DUAN, XF
    MAI, ZH
    CUI, SF
    JOURNAL OF MATERIALS SCIENCE LETTERS, 1993, 12 (19) : 1511 - 1513
  • [25] INTERFACE PROPERTIES OF THIN OXIDES GROWN ON STRAINED GEXSI1-X LAYER
    NAYAK, DK
    PARK, JS
    WOO, JCS
    WANG, KL
    IVANOV, IC
    JOURNAL OF APPLIED PHYSICS, 1994, 76 (02) : 982 - 986
  • [26] Interface properties of thin oxides grown on strained GexSi1-x layer
    1600, American Inst of Physics, Woodbury, NY, USA (76):
  • [27] CHARACTERIZATION OF MBE GROWN SI/GEXSI1-X STRAINED LAYER SUPERLATTICES
    HOUGHTON, DC
    LOCKWOOD, DJ
    DHARMAWARDANA, MWC
    FENTON, EW
    BARIBEAU, JM
    DENHOFF, MW
    JOURNAL OF CRYSTAL GROWTH, 1987, 81 (1-4) : 434 - 439
  • [28] ELECTRON-MICROSCOPY OF GEXSI1-X/SI STRAINED LAYER SUPERLATTICES
    PEROVIC, DD
    WEATHERLY, GC
    HOUGHTON, DC
    EVALUATION OF ADVANCED SEMICONDUCTOR MATERIALS BY ELECTRON MICROSCOPY, 1989, 203 : 355 - 367
  • [29] ESTIMATION OF THE STRAIN STATE OF GEXSI1-X/SI STRAINED-LAYER SUPERLATTICES BY DOUBLE-CRYSTAL X-RAY-DIFFRACTION
    DUAN, XF
    FUNG, KK
    CHU, YM
    JOURNAL OF CRYSTAL GROWTH, 1994, 141 (1-2) : 103 - 108
  • [30] ALGAAS INGAAS GAAS STRAINED-LAYER HETEROJUNCTION BIPOLAR-TRANSISTORS BY MOLECULAR-BEAM EPITAXY
    SULLIVAN, GJ
    ASBECK, PM
    CHANG, MF
    MILLER, DL
    WANG, KC
    ELECTRONICS LETTERS, 1986, 22 (08) : 419 - 421