COMPUTER ENHANCEMENT OF SCANNING ELECTRON MICROGRAPHS

被引：17
作者：
LEWIS, BL [1 ]
SAKRISON, DJ [1 ]
机构：
[1] UNIV CALIF, ELECTR RES LAB, BERKELEY, CA 94720 USA
来源：
IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS | 1975年 / CA22卷 / 03期
关键词：
D O I：
10.1109/TCS.1975.1084027
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：267 / 278
页数：12
相关论文
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