CROSS-SECTIONAL HIGH-RESOLUTION TRANSMISSION ELECTRON-MICROSCOPE STUDIES OF SUPERCONDUCTING OXIDE THIN-FILMS OF THE BI-SYSTEM

被引：6
作者：
IKEDA, S [1 ]
SATO, J [1 ]
NAKAMURA, K [1 ]
机构：
[1] HITACHI CABLE LTD,HITACHI,IBARAKI 317,JAPAN
来源：
MATERIALS TRANSACTIONS JIM | 1990年 / 31卷 / 07期
关键词：
bismuth-strontium-calcium-copper-oxygen; cross-sectional observation; epitaxial growth; high-resolution electron microscopy; oxide superconductor; thin film;
D O I：
10.2320/matertrans1989.31.602
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
Structures of artificial Bi-O/ Sr-Ca-Cu-O multilayered films with a designed period of c=3.7 nm have been examined by a cross-sectional TEM method. The modulated structure similar to bulk BSCCO can be seen in both samples cooled in oxygen, which are superconductors of Tc(zero)= 10-30 K, and samples cooled in vacuum, which are not superconductors. In the films, Bi atoms frequently shift from the standard position of bulk BSCCO. In the most of the grains a and b axes of the films are parallel to <100> of the MgO substrate. The epitaxial growth is discussed considering that both Bi-O layers and MgO have the rock salt type structure. © 1990, The Japan Institute of Metals. All rights reserved.
引用
收藏
页码：602 / 607
页数：6
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