BRILLOUIN-SCATTERING STUDY OF INTERFACE CONSTITUENTS IN A-SI-H/A-SINX-H SUPERLATTICES

被引：5
|
作者：
XIA, H [1 ]
CHENG, GX [1 ]
LIU, GG [1 ]
ZHANG, W [1 ]
CHEN, KJ [1 ]
ZHANG, XK [1 ]
机构：
[1] NANJING UNIV,INST SOLID STATE PHYS,NANJING 21008,PEOPLES R CHINA
来源：
SOLID STATE COMMUNICATIONS | 1990年 / 73卷 / 09期
关键词：
D O I：
10.1016/0038-1098(90)90257-C
中图分类号：
O469 [凝聚态物理学];
学科分类号：
070205 ;
摘要：
The interface structures of a-Si:H/a-SiNx:H have been studied using Brillouin scattering measurements. A simple three-constituents periodic structural model is developed and applied to the specific case of the gradient distribution of hydrogen atoms in the vicinity of interfaces. We semi-quantitatively estimate the width of interface constituent layer to be of 8-11 Å. © 1990.
引用
收藏
页码：657 / 660
页数：4
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