RANDOM PATTERN TESTABILITY

被引：103

作者：

SAVIR, J ^{[1
]}

DITLOW, GS ^{[1
]}

BARDELL, PH ^{[1
]}

机构：

[1] IBM CORP,THOMAS J WATSON RES CTR,YORKTOWN HTS,NY 10598

来源：

关键词：

D O I：

10.1109/TC.1984.5009315

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

引用

页码：79 / 90

页数：12

共 27 条

[1] OUTPUT PROBABILITY EXPRESSION FOR GENERAL COMBINATIONAL NETWORKS
AGGARWAL, KK
[J]. MICROELECTRONICS AND RELIABILITY, 1978, 17 (06): : 601 - 602
[2] PROBABILISTIC ANALYSIS OF RANDOM TEST GENERATION METHOD FOR IRREDUNDANT COMBINATIONAL LOGIC NETWORKS
AGRAWAL, P
AGRAWAL, VD
[J]. IEEE TRANSACTIONS ON COMPUTERS, 1975, C 24 (07) : 691 - 695
[3] BARDELL PH, 1982, 1982 P IEEE INT TEST, P200
[4] BARZILAI Z, 1981, IEEE T COMPUT, V30, P996, DOI 10.1109/TC.1981.1675744
[5] Breuer M. A., 1976, DIAGNOSIS RELIABLE D
[6] BROWN A, UNPUB IBM TECH DISCL
[7] ELECTRICAL DESIGN OF A HIGH-SPEED COMPUTER PACKAGE
DAVIDSON, EE
[J]. IBM JOURNAL OF RESEARCH AND DEVELOPMENT, 1982, 26 (03) : 349 - 361
[8] DITLOW G, UNPUB IBM TECH DISCL
[9] RANDOM-PATTERN COVERAGE ENHANCEMENT AND DIAGNOSIS FOR LSSD LOGIC SELF-TEST
EICHELBERGER, EB
LINDBLOOM, E
[J]. IBM JOURNAL OF RESEARCH AND DEVELOPMENT, 1983, 27 (03) : 265 - 272
[10] EICHELBERGER EB, 1977, 14TH P DES AUT C, P462