ELECTRICAL BAND-GAP NARROWING IN N-TYPE AND P-TYPE HEAVILY DOPED SILICON AT 300 K

被引:2
作者
VANCONG, H
BRUNET, S
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D O I
10.1016/0038-1101(86)90003-1
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TM [电工技术]; TN [电子技术、通信技术];
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0808 ; 0809 ;
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页码:857 / 860
页数:4
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