A REVIEW OF THE APPLICATION OF ANALYTICAL ELECTRON-MICROSCOPY TO ION-IMPLANTED MATERIALS

被引：8
作者：
BENTLEY, J
机构：
来源：
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS | 1986年 / 16卷 / 2-3期
关键词：
D O I：
10.1016/0168-583X(86)90002-9
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
引用
收藏
页码：111 / 125
页数：15
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