EXAFS STRUCTURES OF TECHNETIUM IN GLASSES PREPARED UNDER DIFFERENT REDOX CONDITIONS

被引：15

作者：

ANTONINI, M

MERLINI, AE

THORNLEY, RF

机构：

[1] UNIV MODENA,GRP NAZL STRUTTURA MAT,I-41100 MODENA,ITALY

[2] JOINT RES CTR,DIV PHYS,I-21020 VARESE,ITALY

[3] UNIV STRATHCLYDE,DEPT APPL PHYS,GLASGOW G4 0NG,SCOTLAND

来源：

JOURNAL OF NON-CRYSTALLINE SOLIDS | 1985年 / 71卷 / 1-3期

关键词：

BOROSILICATE GLASSES - EXTENDED X-RAY ABSORPTION FINE STRUCTURE - TECHNETIUM-CONTAINING GLASSES;

D O I：

10.1016/0022-3093(85)90290-X

中图分类号：

TQ174 [陶瓷工业]; TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

引用

页码：219 / 225

页数：7

共 15 条

[1]

ALLARD B, 1979, RADIOCHEM RADIOA LET, V37, P223

[2]

ANTONINI M, 1984, UNPUB 3RD P INT EXAF

[3] INVESTIGATION ON TECHNETIUM SPECIES IN GROUNDWATER AND MIGRATION THROUGH CLAY COLUMNS [J].

BIDOGLIO, G ;

CHATT, A ;

DEPLANO, A ;

ZORN, F .

JOURNAL OF RADIOANALYTICAL CHEMISTRY, 1983, 79 (01) :153-164

[4]

BRADLEY DJ, 1979, PNL3152 PAC NW LAB T

[5]

HAYES TM, 1982, SOLID STATE PHYS, V37, P173

[6]

KHALIL MY, 1984, SCI BASIS NUCLEAR WA, V7, P655

[7]

KOTEGOV VKV, 1968, ADV INORG CHEM RAD, V2, P1

[8]

LANZA F, 1983, APR P EUR WORKSH PHY

[9]

LANZA F, 1984, SA107C28406 COMM EUR

[10] EXTENDED X-RAY ABSORPTION FINE-STRUCTURE - ITS STRENGTHS AND LIMITATIONS AS A STRUCTURAL TOOL [J].

LEE, PA ;

CITRIN, PH ;

EISENBERGER, P ;

KINCAID, BM .

REVIEWS OF MODERN PHYSICS, 1981, 53 (04) :769-806

← 1 2 →