SODIUM PASSIVATION IN HCL OXIDE-FILMS ON SI

被引:38
作者
ROHATGI, A
BUTLER, SR
FEIGL, FJ
KRANER, HW
JONES, KW
机构
[1] LEHIGH UNIV,SHERMAN FAIRCHILD LAB,BETHLEHEM,PA 18015
[2] BROOKHAVEN NATL LAB,UPTON,NY 11973
关键词
D O I
10.1063/1.89305
中图分类号
O59 [应用物理学];
学科分类号
摘要
引用
收藏
页码:104 / 106
页数:3
相关论文
共 11 条
[1]   PRINCIPLES AND APPLICATIONS OF ION-BEAM TECHNIQUES FOR ANALYSIS OF SOLIDS AND THIN-FILMS [J].
CHU, WK ;
MAYER, JW ;
NICOLET, MA ;
BUCK, TM ;
AMSEL, G ;
EISEN, F .
THIN SOLID FILMS, 1973, 17 (01) :1-41
[2]  
DEAL BE, 1974, J ELECTROCHEM SOC, V121, P198
[3]   PROTON AND SODIUM TRANSPORT IN SIO2 FILMS [J].
HOFSTEIN, SR .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1967, ED14 (11) :749-+
[4]   EFFECT OF HCL AND CL2 ON THERMAL OXIDATION OF SILICON [J].
KRIEGLER, RJ ;
CHENG, YC ;
COLTON, DR .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1972, 119 (03) :388-&
[5]  
KRIEGLER RJ, 1973, DENKI KAGAKU, V41, P466
[6]   RESIDUAL CHLORINE IN O2-HCL GROWN SIO2 [J].
MEEK, RL .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1973, 120 (02) :308-310
[7]  
OTA Y, 1974, J ELECTROCHEM SOC, V121, P1107, DOI 10.1149/1.2401986
[8]   TRANSFER OF MOBILE IONS FROM AQUEOUS-SOLUTIONS TO SILICON DIOXIDE SURFACE [J].
RAIDER, SI ;
GREGOR, LV ;
FLITSCH, R .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1973, 120 (03) :425-431
[9]   ION TRANSPORT PHENOMENA IN INSULATING FILMS [J].
SNOW, EH ;
GROVE, AS ;
DEAL, BE ;
SAH, CT .
JOURNAL OF APPLIED PHYSICS, 1965, 36 (05) :1664-&
[10]   PROPERTIES OF SIO2 GROWN IN PRESENCE OF HCL OR C-12 [J].
VANDERMEULEN, YJ ;
OSBURN, CM ;
ZIEGLER, JF .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1975, 122 (02) :284-290