THE PRODUCTION OF EPITAXIAL LAYERS OF SILICON BY ION-BEAM SPUTTERING

被引:1
作者
SCHWEBEL, C
MEYER, F
GAUTHERIN, G
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JOURNAL DE PHYSIQUE | 1982年 / 43卷 / NC-5期
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D O I
10.1051/jphyscol:1982557
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页码:473 / 479
页数:7
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[1]  
ANDERSEN HH, TOPICS APPLIED PHYSI, V47, P169
[2]   LIGHT-SCATTERING INVESTIGATION OF NATURE OF POLISHED GLASS SURFACES [J].
CROCE, P ;
PRODHOMME, L .
NOUVELLE REVUE D OPTIQUE, 1976, 7 (02) :121-132
[3]   SOME TRENDS IN PREPARING FILM STRUCTURES BY ION-BEAM METHODS [J].
GAUTHERIN, G ;
WEISSMANTEL, C .
THIN SOLID FILMS, 1978, 50 (MAY) :135-144
[4]   A REVIEW OF SURFACE SPECTROSCOPIES FOR SEMICONDUCTOR CHARACTERIZATION [J].
HELMS, CR .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1982, 20 (04) :948-952
[6]   ELECTRICAL PROPERTIES OF SILICON CONTAINING ARSENIC AND BORON [J].
MORIN, FJ ;
MAITA, JP .
PHYSICAL REVIEW, 1954, 96 (01) :28-35
[7]   SILICON MOLECULAR-BEAM EPITAXY WITH SIMULTANEOUS ION IMPLANT DOPING [J].
OTA, Y .
JOURNAL OF APPLIED PHYSICS, 1980, 51 (02) :1102-1110
[8]  
SCHWEBEL C, CIP, V79, P361
[9]   DEPOSITION OF EPITAXIAL LAYERS BY ION-BEAM METHODS [J].
WEISSMANTEL, C ;
HECHT, G ;
HINNEBERG, HJ .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY, 1980, 17 (04) :812-816
[10]   ION-BEAM TECHNIQUES FOR THIN AND THICK-FILM DEPOSITION [J].
WEISSMANTEL, C ;
ERLER, HJ ;
REISSE, G .
SURFACE SCIENCE, 1979, 86 (JUL) :207-221