共 10 条
[1]
ANDERSEN HH, TOPICS APPLIED PHYSI, V47, P169
[2]
LIGHT-SCATTERING INVESTIGATION OF NATURE OF POLISHED GLASS SURFACES
[J].
NOUVELLE REVUE D OPTIQUE,
1976, 7 (02)
:121-132
[4]
A REVIEW OF SURFACE SPECTROSCOPIES FOR SEMICONDUCTOR CHARACTERIZATION
[J].
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY,
1982, 20 (04)
:948-952
[6]
ELECTRICAL PROPERTIES OF SILICON CONTAINING ARSENIC AND BORON
[J].
PHYSICAL REVIEW,
1954, 96 (01)
:28-35
[8]
SCHWEBEL C, CIP, V79, P361
[9]
DEPOSITION OF EPITAXIAL LAYERS BY ION-BEAM METHODS
[J].
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY,
1980, 17 (04)
:812-816
[10]
ION-BEAM TECHNIQUES FOR THIN AND THICK-FILM DEPOSITION
[J].
SURFACE SCIENCE,
1979, 86 (JUL)
:207-221