X-RAY METHOD FOR DETERMINATION OF POLARITY OF SIC CRYSTALS

被引：40

作者：

BRACK, K

机构：

来源：

JOURNAL OF APPLIED PHYSICS | 1965年 / 36卷 / 11期

关键词：

D O I：

10.1063/1.1703040

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

引用

页码：3560 / &

共 11 条

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[3] Differences in the Intensity of X-Ray Reflection from the two 111-surfaces of Sphalerite [J].

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[4]

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[5]

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[8]

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[9]

PFISTER H, 1961, Z NATURFORSCH, VA 16, P427

[10] X-RAY METHOD FOR THE DIFFERENTIATION OF (111) SURFACES IN AIIIBV SEMICONDUCTING COMPOUNDS [J].

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JOURNAL OF APPLIED PHYSICS, 1959, 30 (07) :960-962

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